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High frequency characterization of PZT thin-films deposited..:
Feutmba, Gilles F.
;
da Silva, Leandro
;
Singh, Nishant
...
Optical Materials Express. 13 (2023) 7 - p. 2120 , 2023
Link:
https://doi.org/10.1364/ome.494148
RT Journal T1
High frequency characterization of PZT thin-films deposited by chemical solution deposition on SOI for integrated high speed electro-optic modulators
UL https://suche.suub.uni-bremen.de/peid=cr-10.1364_ome.494148&Exemplar=1&LAN=DE A1 Feutmba, Gilles F. A1 da Silva, Leandro A1 Singh, Nishant A1 Breyne, Laurens A1 De Geest, Kobe A1 George, John Puthenparampil A1 Bauwelinck, Johan A1 Van Thourhout, Dries A1 Yin, Xin A1 Beeckman, Jeroen PB Optica Publishing Group YR 2023 SN 2159-3930 JF Optical Materials Express VO 13 IS 7 SP 2120 LK http://dx.doi.org/https://doi.org/10.1364/ome.494148 DO https://doi.org/10.1364/ome.494148 SF ELIB - SuUB Bremen
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