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1 Ergebnisse
1
Non-Destructive Electroluminescence Inspection for LED Epit..:
Su, Hao
;
Qiu, Jiawen
;
Li, Junlong
...
Photonics Research. , 2024
Link:
https://doi.org/10.1364/prj.522697
RT Journal T1
Non-Destructive Electroluminescence Inspection for LED Epitaxial Wafers Based on Soft Single-Contact Operation
UL https://suche.suub.uni-bremen.de/peid=cr-10.1364_prj.522697&Exemplar=1&LAN=DE A1 Su, Hao A1 Qiu, Jiawen A1 Li, Junlong A1 Chen, Rong A1 Le, Jianbi A1 Lei, Xiaoyang A1 zhang, yongai A1 zhou, xiongtu A1 Guo, Tailiang A1 Wu, Chaoxing PB Optica Publishing Group YR 2024 SN 2327-9125 JF Photonics Research LK http://dx.doi.org/https://doi.org/10.1364/prj.522697 DO https://doi.org/10.1364/prj.522697 SF ELIB - SuUB Bremen
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