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1 Ergebnisse
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Reliability Analysis of Radiation Tolerant Low Voltage CCCI..:
Rizvi, Saiyid Mohammad Irshad
;
Paul, Sajal K
;
Pandey, Neeta
..
Defence Science Journal. 72 (2022) 6 - p. 854-863 , 2022
Link:
https://doi.org/10.14429/dsj.72.17583
RT Journal T1
Reliability Analysis of Radiation Tolerant Low Voltage CCCII Circuit For Space Applications
UL https://suche.suub.uni-bremen.de/peid=cr-10.14429_dsj.72.17583&Exemplar=1&LAN=DE A1 Rizvi, Saiyid Mohammad Irshad A1 Paul, Sajal K A1 Pandey, Neeta A1 Tiwari, Manoj Kumar A1 Pathak, Aruna PB Defence Scientific Information and Documentation Centre YR 2022 SN 0976-464X SN 0011-748X JF Defence Science Journal VO 72 IS 6 SP 854 OP 863 LK http://dx.doi.org/https://doi.org/10.14429/dsj.72.17583 DO https://doi.org/10.14429/dsj.72.17583 SF ELIB - SuUB Bremen
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