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Examination of dielectric strength of thin Parylene C films..:
Heid, Andreas
;
Metzen, Rene von
;
Stett, Alfred
.
Current Directions in Biomedical Engineering. 2 (2016) 1 - p. 39-41 , 2016
Link:
https://doi.org/10.1515/cdbme-2016-0012
RT Journal T1 <Title>Examination of dielectric strength of thin Parylene C films under various conditions</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1515_cdbme-2016-0012&Exemplar=1&LAN=DE A1 Heid, Andreas A1 Metzen, Rene von A1 Stett, Alfred A1 Bucher, Volker PB Walter de Gruyter GmbH YR 2016 SN 2364-5504 JF Current Directions in Biomedical Engineering VO 2 IS 1 SP 39 OP 41 LK http://dx.doi.org/https://doi.org/10.1515/cdbme-2016-0012 DO https://doi.org/10.1515/cdbme-2016-0012 SF ELIB - SuUB Bremen
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