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Depth-resolved residual stress evaluation from X-ray diffra..:
Schuster, T.
;
Plöger, J.
;
Louis, A. K.
International Journal of Materials Research. 94 (2022) 8 - p. 934-937 , 2022
Link:
https://doi.org/10.1515/ijmr-2003-0166
RT Journal T1 <Title>Depth-resolved residual stress evaluation from X-ray diffraction measurement data using the approximate inverse method</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1515_ijmr-2003-0166&Exemplar=1&LAN=DE A1 Schuster, T. A1 Plöger, J. A1 Louis, A. K. PB Walter de Gruyter GmbH YR 2022 SN 2195-8556 SN 1862-5282 JF International Journal of Materials Research VO 94 IS 8 SP 934 OP 937 LK http://dx.doi.org/https://doi.org/10.1515/ijmr-2003-0166 DO https://doi.org/10.1515/ijmr-2003-0166 SF ELIB - SuUB Bremen
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