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Security Problems of Scan Design and Accompanying Measures:
Biasizzo, Anton
;
Novak, Franc
Journal of Electrical Engineering. 67 (2016) 3 - p. 192-198 , 2016
Link:
https://doi.org/10.1515/jee-2016-0027
RT Journal T1 <Title>Security Problems of Scan Design and Accompanying Measures</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1515_jee-2016-0027&Exemplar=1&LAN=DE A1 Biasizzo, Anton A1 Novak, Franc PB Walter de Gruyter GmbH YR 2016 SN 1339-309X JF Journal of Electrical Engineering VO 67 IS 3 SP 192 OP 198 LK http://dx.doi.org/https://doi.org/10.1515/jee-2016-0027 DO https://doi.org/10.1515/jee-2016-0027 SF ELIB - SuUB Bremen
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