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1 Ergebnisse
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Optical properties of defects in nitride semiconductors:
Tischer, Ingo
;
Hocker, Matthias
;
Neuschl, Benjamin
...
Journal of Materials Research. 30 (2015) 20 - p. 2977-2990 , 2015
Link:
https://doi.org/10.1557/jmr.2015.273
RT Journal T1
Optical properties of defects in nitride semiconductors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1557_jmr.2015.273&Exemplar=1&LAN=DE A1 Tischer, Ingo A1 Hocker, Matthias A1 Neuschl, Benjamin A1 Madel, Manfred A1 Feneberg, Martin A1 Schirra, Martin A1 Frey, Manuel A1 Knab, Manuel A1 Maier, Pascal A1 Wunderer, Thomas A1 Leute, Robert A.R. A1 Wang, Junjun A1 Scholz, Ferdinand A1 Biskupek, Johannes A1 Bernhard, Jörg A1 Kaiser, Ute A1 Simon, Ulrich A1 Dieterle, Levin A1 Groiss, Heiko A1 Müller, Erich A1 Gerthsen, Dagmar A1 Thonke, Klaus PB Springer Science and Business Media LLC YR 2015 SN 0884-2914 SN 2044-5326 JF Journal of Materials Research VO 30 IS 20 SP 2977 OP 2990 LK http://dx.doi.org/https://doi.org/10.1557/jmr.2015.273 DO https://doi.org/10.1557/jmr.2015.273 SF ELIB - SuUB Bremen
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