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A method for quantitative nanoscale imaging of dopant distr..:
Eswara, Santhana
;
Pshenova, Alisa
;
Lentzen, Esther
...
MRS Communications. 9 (2019) 3 - p. 916-923 , 2019
Link:
https://doi.org/10.1557/mrc.2019.89
RT Journal T1
A method for quantitative nanoscale imaging of dopant distributions using secondary ion mass spectrometry: an application example in silicon photovoltaics
UL https://suche.suub.uni-bremen.de/peid=cr-10.1557_mrc.2019.89&Exemplar=1&LAN=DE A1 Eswara, Santhana A1 Pshenova, Alisa A1 Lentzen, Esther A1 Nogay, Gizem A1 Lehmann, Mario A1 Ingenito, Andrea A1 Jeangros, Quentin A1 Haug, Franz-Josef A1 Valle, Nathalie A1 Philipp, Patrick A1 Hessler-Wyser, Aïcha A1 Wirtz, Tom PB Springer Science and Business Media LLC YR 2019 SN 2159-6859 SN 2159-6867 JF MRS Communications VO 9 IS 3 SP 916 OP 923 LK http://dx.doi.org/https://doi.org/10.1557/mrc.2019.89 DO https://doi.org/10.1557/mrc.2019.89 SF ELIB - SuUB Bremen
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