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1 Ergebnisse
1
Self-correcting check bit generator of error correction cod..:
Cha, Sanguhn
;
Yoon, Hongil
IEICE Electronics Express. 10 (2013) 6 - p. 20130103-20130103 , 2013
Link:
https://doi.org/10.1587/elex.10.20130103
RT Journal T1 <Title>Self-correcting check bit generator of error correction codes for memories</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_elex.10.20130103&Exemplar=1&LAN=DE A1 Cha, Sanguhn A1 Yoon, Hongil PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2013 SN 1349-2543 JF IEICE Electronics Express VO 10 IS 6 SP 20130103 OP 20130103 LK http://dx.doi.org/https://doi.org/10.1587/elex.10.20130103 DO https://doi.org/10.1587/elex.10.20130103 SF ELIB - SuUB Bremen
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