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1 Ergebnisse
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Collection of charge in NMOS from single event effect:
Wang, Jingqiu
;
Lin, Fujiang
;
Wang, Donglin
...
IEICE Electronics Express. 13 (2016) 8 - p. 20160014-20160014 , 2016
Link:
https://doi.org/10.1587/elex.13.20160014
RT Journal T1 <Title>Collection of charge in NMOS from single event effect</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_elex.13.20160014&Exemplar=1&LAN=DE A1 Wang, Jingqiu A1 Lin, Fujiang A1 Wang, Donglin A1 Song, Wenna A1 Liu, Li A1 Song, Qiwei A1 Chen, Liang PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2016 SN 1349-2543 JF IEICE Electronics Express VO 13 IS 8 SP 20160014 OP 20160014 LK http://dx.doi.org/https://doi.org/10.1587/elex.13.20160014 DO https://doi.org/10.1587/elex.13.20160014 SF ELIB - SuUB Bremen
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