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1 Ergebnisse
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Time-multiplexed test access architecture for stacked integ..:
Ansari, Muhammad Adil
;
Jung, Jihun
;
Kim, Dooyoung
.
IEICE Electronics Express. 13 (2016) 14 - p. 20160314-20160314 , 2016
Link:
https://doi.org/10.1587/elex.13.20160314
RT Journal T1
Time-multiplexed test access architecture for stacked integrated circuits
UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_elex.13.20160314&Exemplar=1&LAN=DE A1 Ansari, Muhammad Adil A1 Jung, Jihun A1 Kim, Dooyoung A1 Park, Sungju PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2016 SN 1349-2543 JF IEICE Electronics Express VO 13 IS 14 SP 20160314 OP 20160314 LK http://dx.doi.org/https://doi.org/10.1587/elex.13.20160314 DO https://doi.org/10.1587/elex.13.20160314 SF ELIB - SuUB Bremen
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