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1 Ergebnisse
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Total ionizing dose radiation effect on the threshold volta..:
Hao, Minru
;
Hu, Huiyong
;
Liao, Chenguang
...
IEICE Electronics Express. 14 (2017) 11 - p. 20170411-20170411 , 2017
Link:
https://doi.org/10.1587/elex.14.20170411
RT Journal T1 <Title>Total ionizing dose radiation effect on the threshold voltage for the uniaxial strained Si nano NMOSFET</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_elex.14.20170411&Exemplar=1&LAN=DE A1 Hao, Minru A1 Hu, Huiyong A1 Liao, Chenguang A1 Kang, Haiyan A1 Su, Han A1 Zhang, Qian A1 Zhao, Yingbo PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2017 SN 1349-2543 JF IEICE Electronics Express VO 14 IS 11 SP 20170411 OP 20170411 LK http://dx.doi.org/https://doi.org/10.1587/elex.14.20170411 DO https://doi.org/10.1587/elex.14.20170411 SF ELIB - SuUB Bremen
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