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A system-on-chip for series arc fault acquisition in smart ..:
Zhang, Peiyong
;
Su, Yuquan
;
Li, Yike
.
IEICE Electronics Express. 19 (2022) 11 - p. 20220163-20220163 , 2022
Link:
https://doi.org/10.1587/elex.19.20220163
RT Journal T1 <Title>A system-on-chip for series arc fault acquisition in smart grid based on two configurable sampling rate SAR ADCs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_elex.19.20220163&Exemplar=1&LAN=DE A1 Zhang, Peiyong A1 Su, Yuquan A1 Li, Yike A1 Huang, Kaitian PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2022 SN 1349-2543 JF IEICE Electronics Express VO 19 IS 11 SP 20220163 OP 20220163 LK http://dx.doi.org/https://doi.org/10.1587/elex.19.20220163 DO https://doi.org/10.1587/elex.19.20220163 SF ELIB - SuUB Bremen
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