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1 Ergebnisse
1
Power, performance, and area evaluation across 180nm-28nm t..:
Yin, Minghui
;
Li, Zhiqiang
;
Zhang, Weihua
...
IEICE Electronics Express. 21 (2024) 9 - p. 20240194-20240194 , 2024
Link:
https://doi.org/10.1587/elex.21.20240194
RT Journal T1
Power, performance, and area evaluation across 180nm-28nm technology nodes based on benchmark circuits
UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_elex.21.20240194&Exemplar=1&LAN=DE A1 Yin, Minghui A1 Li, Zhiqiang A1 Zhang, Weihua A1 Liu, Hongwei A1 Zhou, Huanhuan A1 You, Yunxia A1 Wang, Chen PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2024 SN 1349-2543 JF IEICE Electronics Express VO 21 IS 9 SP 20240194 OP 20240194 LK http://dx.doi.org/https://doi.org/10.1587/elex.21.20240194 DO https://doi.org/10.1587/elex.21.20240194 SF ELIB - SuUB Bremen
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