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1 Ergebnisse
1
Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops..:
NAKAJIMA, Ryuichi
;
ITO, Takafumi
;
SUGITANI, Shotaro
...
IEICE Transactions on Electronics. E107.C (2024) 7 - p. 191-200 , 2024
Link:
https://doi.org/10.1587/transele.2023cdp0004
RT Journal T1
Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies
UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_transele.2023cdp0004&Exemplar=1&LAN=DE A1 NAKAJIMA, Ryuichi A1 ITO, Takafumi A1 SUGITANI, Shotaro A1 KII, Tomoya A1 EBARA, Mitsunori A1 FURUTA, Jun A1 KOBAYASHI, Kazutoshi A1 LOUVAT, Mathieu A1 JACQUET, Francois A1 ELOY, Jean-Christophe A1 MONTFORT, Olivier A1 JURE, Lionel A1 HUARD, Vincent PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2024 SN 0916-8524 SN 1745-1353 JF IEICE Transactions on Electronics VO E107.C IS 7 SP 191 OP 200 LK http://dx.doi.org/https://doi.org/10.1587/transele.2023cdp0004 DO https://doi.org/10.1587/transele.2023cdp0004 SF ELIB - SuUB Bremen
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