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1 Ergebnisse
1
Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separat..:
FURUTA, Jun
;
SUGITANI, Shotaro
;
NAKAJIMA, Ryuichi
..
IEICE Transactions on Electronics. , 2024
Link:
https://doi.org/10.1587/transele.2023ecp5045
RT Journal T1
Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separately by Heavy-ion and Neutron Irradiation
UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_transele.2023ecp5045&Exemplar=1&LAN=DE A1 FURUTA, Jun A1 SUGITANI, Shotaro A1 NAKAJIMA, Ryuichi A1 ITO, Takafumi A1 KOBAYASHI, Kazutoshi PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2024 SN 0916-8524 SN 1745-1353 JF IEICE Transactions on Electronics LK http://dx.doi.org/https://doi.org/10.1587/transele.2023ecp5045 DO https://doi.org/10.1587/transele.2023ecp5045 SF ELIB - SuUB Bremen
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