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Evaluation of Information Leakage from Cryptographic Hardwa..:
HAYASHI, Yu-ichi
;
HOMMA, Naofumi
;
MIZUKI, Takaaki
...
IEICE Transactions on Electronics. E95.C (2012) 6 - p. 1089-1097 , 2012
Link:
https://doi.org/10.1587/transele.e95.c.1089
RT Journal T1
Evaluation of Information Leakage from Cryptographic Hardware via Common-Mode Current
UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_transele.e95.c.1089&Exemplar=1&LAN=DE A1 HAYASHI, Yu-ichi A1 HOMMA, Naofumi A1 MIZUKI, Takaaki A1 SUGAWARA, Takeshi A1 KAYANO, Yoshiki A1 AOKI, Takafumi A1 MINEGISHI, Shigeki A1 SATOH, Akashi A1 SONE, Hideaki A1 INOUE, Hiroshi PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2012 SN 0916-8524 SN 1745-1353 JF IEICE Transactions on Electronics VO E95.C IS 6 SP 1089 OP 1097 LK http://dx.doi.org/https://doi.org/10.1587/transele.e95.c.1089 DO https://doi.org/10.1587/transele.e95.c.1089 SF ELIB - SuUB Bremen
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