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Power Noise Measurements of Cryptographic VLSI Circuits Reg..:
FUJIMOTO, Daisuke
;
MIURA, Noriyuki
;
NAGATA, Makoto
...
IEICE Transactions on Electronics. E97.C (2014) 4 - p. 272-279 , 2014
Link:
https://doi.org/10.1587/transele.e97.c.272
RT Journal T1
Power Noise Measurements of Cryptographic VLSI Circuits Regarding Side-Channel Information Leakage
UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_transele.e97.c.272&Exemplar=1&LAN=DE A1 FUJIMOTO, Daisuke A1 MIURA, Noriyuki A1 NAGATA, Makoto A1 HAYASHI, Yuichi A1 HOMMA, Naofumi A1 AOKI, Takafumi A1 HORI, Yohei A1 KATASHITA, Toshihiro A1 SAKIYAMA, Kazuo A1 LE, Thanh-Ha A1 BRINGER, Julien A1 BAZARGAN-SABET, Pirouz A1 BHASIN, Shivam A1 DANGER, Jean-Luc PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2014 SN 0916-8524 SN 1745-1353 JF IEICE Transactions on Electronics VO E97.C IS 4 SP 272 OP 279 LK http://dx.doi.org/https://doi.org/10.1587/transele.e97.c.272 DO https://doi.org/10.1587/transele.e97.c.272 SF ELIB - SuUB Bremen
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