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1 Ergebnisse
1
Sequential Locally Optimum Test (SLOT): A Sequential Detect..:
BAE, Jinsoo
;
PARK, Seong Ill
;
KIM, Yun Hee
...
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. E93-A (2010) 11 - p. 2045-2056 , 2010
Link:
https://doi.org/10.1587/transfun.e93.a.2045
RT Journal T1 <Title>Sequential Locally Optimum Test (SLOT): A Sequential Detection Scheme Based on Locally Optimum Test Statistic</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_transfun.e93.a.2045&Exemplar=1&LAN=DE A1 BAE, Jinsoo A1 PARK, Seong Ill A1 KIM, Yun Hee A1 YOON, Seokho A1 OH, Jongho A1 SONG, Iickho A1 OH, Seong-Jun PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2010 SN 0916-8508 SN 1745-1337 JF IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences VO E93-A IS 11 SP 2045 OP 2056 LK http://dx.doi.org/https://doi.org/10.1587/transfun.e93.a.2045 DO https://doi.org/10.1587/transfun.e93.a.2045 SF ELIB - SuUB Bremen
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