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Maximal Interconnect Resilient Methodology for Fault Tolera..:
LI, Katherine Shu-Min
;
PAI, Chih-Yun
;
CHEN, Liang-Bi
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. E94-A (2011) 12 - p. 2649-2658 , 2011
Link:
https://doi.org/10.1587/transfun.e94.a.2649
RT Journal T1 <Title>Maximal Interconnect Resilient Methodology for Fault Tolerance, Yield, and Reliability Improvement in Network on Chip</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_transfun.e94.a.2649&Exemplar=1&LAN=DE A1 LI, Katherine Shu-Min A1 PAI, Chih-Yun A1 CHEN, Liang-Bi PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2011 SN 0916-8508 SN 1745-1337 JF IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences VO E94-A IS 12 SP 2649 OP 2658 LK http://dx.doi.org/https://doi.org/10.1587/transfun.e94.a.2649 DO https://doi.org/10.1587/transfun.e94.a.2649 SF ELIB - SuUB Bremen
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