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A Fast Power Current Simulation of Cryptographic VLSI Circu..:
FUJIMOTO, Daisuke
;
KATASHITA, Toshihiro
;
SASAKI, Akihiko
...
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. E96.A (2013) 12 - p. 2533-2541 , 2013
Link:
https://doi.org/10.1587/transfun.e96.a.2533
RT Journal T1 <Title>A Fast Power Current Simulation of Cryptographic VLSI Circuits for Side Channel Attack Evaluation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_transfun.e96.a.2533&Exemplar=1&LAN=DE A1 FUJIMOTO, Daisuke A1 KATASHITA, Toshihiro A1 SASAKI, Akihiko A1 HORI, Yohei A1 SATOH, Akashi A1 NAGATA, Makoto PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2013 SN 0916-8508 SN 1745-1337 JF IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences VO E96.A IS 12 SP 2533 OP 2541 LK http://dx.doi.org/https://doi.org/10.1587/transfun.e96.a.2533 DO https://doi.org/10.1587/transfun.e96.a.2533 SF ELIB - SuUB Bremen
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