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1 Ergebnisse
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On Achieving Capture Power Safety in At-Speed Scan-Based Lo..:
TOMITA, Akihiro
;
WEN, Xiaoqing
;
SATO, Yasuo
...
IEICE Transactions on Information and Systems. E97.D (2014) 10 - p. 2706-2718 , 2014
Link:
https://doi.org/10.1587/transinf.2014edp7039
RT Journal T1 <Title>On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_transinf.2014edp7039&Exemplar=1&LAN=DE A1 TOMITA, Akihiro A1 WEN, Xiaoqing A1 SATO, Yasuo A1 KAJIHARA, Seiji A1 MIYASE, Kohei A1 HOLST, Stefan A1 GIRARD, Patrick A1 TEHRANIPOOR, Mohammad A1 WANG, Laung-Terng PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2014 SN 0916-8532 SN 1745-1361 JF IEICE Transactions on Information and Systems VO E97.D IS 10 SP 2706 OP 2718 LK http://dx.doi.org/https://doi.org/10.1587/transinf.2014edp7039 DO https://doi.org/10.1587/transinf.2014edp7039 SF ELIB - SuUB Bremen
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