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1 Ergebnisse
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A Design for Testability of Open Defects at Interconnects i..:
ASHIKIN, Fara
;
HASHIZUME, Masaki
;
YOTSUYANAGI, Hiroyuki
..
IEICE Transactions on Information and Systems. E101.D (2018) 8 - p. 2053-2063 , 2018
Link:
https://doi.org/10.1587/transinf.2018edp7093
RT Journal T1 <Title>A Design for Testability of Open Defects at Interconnects in 3D Stacked ICs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_transinf.2018edp7093&Exemplar=1&LAN=DE A1 ASHIKIN, Fara A1 HASHIZUME, Masaki A1 YOTSUYANAGI, Hiroyuki A1 LU, Shyue-Kung A1 ROTH, Zvi PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2018 SN 0916-8532 SN 1745-1361 JF IEICE Transactions on Information and Systems VO E101.D IS 8 SP 2053 OP 2063 LK http://dx.doi.org/https://doi.org/10.1587/transinf.2018edp7093 DO https://doi.org/10.1587/transinf.2018edp7093 SF ELIB - SuUB Bremen
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