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Aggregate Signature Schemes with Traceability of Devices Dy..:
ISHII, Ryu
;
YAMASHITA, Kyosuke
;
SAKAI, Yusuke
...
IEICE Transactions on Information and Systems. E105.D (2022) 11 - p. 1845-1856 , 2022
Link:
https://doi.org/10.1587/transinf.2022ngp0010
RT Journal T1 <Title>Aggregate Signature Schemes with Traceability of Devices Dynamically Generating Invalid Signatures</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_transinf.2022ngp0010&Exemplar=1&LAN=DE A1 ISHII, Ryu A1 YAMASHITA, Kyosuke A1 SAKAI, Yusuke A1 TERUYA, Tadanori A1 MATSUDA, Takahiro A1 HANAOKA, Goichiro A1 MATSUURA, Kanta A1 MATSUMOTO, Tsutomu PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2022 SN 0916-8532 SN 1745-1361 JF IEICE Transactions on Information and Systems VO E105.D IS 11 SP 1845 OP 1856 LK http://dx.doi.org/https://doi.org/10.1587/transinf.2022ngp0010 DO https://doi.org/10.1587/transinf.2022ngp0010 SF ELIB - SuUB Bremen
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