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1 Ergebnisse
1
Scan Shift Time Reduction Using Test Compaction for On-Chip..:
ZHANG, Wenpo
;
NAMBA, Kazuteru
;
ITO, Hideo
IEICE Transactions on Information and Systems. E97.D (2014) 3 - p. 533-540 , 2014
Link:
https://doi.org/10.1587/transinf.e97.d.533
RT Journal T1 <Title>Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1587_transinf.e97.d.533&Exemplar=1&LAN=DE A1 ZHANG, Wenpo A1 NAMBA, Kazuteru A1 ITO, Hideo PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2014 SN 0916-8532 SN 1745-1361 JF IEICE Transactions on Information and Systems VO E97.D IS 3 SP 533 OP 540 LK http://dx.doi.org/https://doi.org/10.1587/transinf.e97.d.533 DO https://doi.org/10.1587/transinf.e97.d.533 SF ELIB - SuUB Bremen
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