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1 Ergebnisse
1
P‐91: A Method for Detecting and Classifying the Mura Pheno..:
Wu, Yung‐Hsun
;
Hsu, Chuan‐Wei
;
Chen, Chueh‐Ju
..
SID Symposium Digest of Technical Papers. 39 (2008) 1 - p. 1525-1528 , 2008
Link:
https://doi.org/10.1889/1.3069448
RT Journal T1 <Title>P‐91: A Method for Detecting and Classifying the Mura Phenomena in TFT‐LCDs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1889_1.3069448&Exemplar=1&LAN=DE A1 Wu, Yung‐Hsun A1 Hsu, Chuan‐Wei A1 Chen, Chueh‐Ju A1 Yang, Chiu‐Lien A1 Pang, Jia‐Pang PB Wiley YR 2008 SN 0097-966X SN 2168-0159 JF SID Symposium Digest of Technical Papers VO 39 IS 1 SP 1525 OP 1528 LK http://dx.doi.org/https://doi.org/10.1889/1.3069448 DO https://doi.org/10.1889/1.3069448 SF ELIB - SuUB Bremen
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