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Characterization of the Electrical Properties of Silicon Na..:
Lin, Yen-Heng
;
Wong, Jing-Chao
;
Peng, Yong-Sheng
International Journal of Electrochemical Science. 12 (2017) 9 - p. 8651-8662 , 2017
Link:
https://doi.org/10.20964/2017.09.42
RT Journal T1 <Title>Characterization of the Electrical Properties of Silicon Nanowire using the Dielectrophoretic Assembling Platform</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.20964_2017.09.42&Exemplar=1&LAN=DE A1 Lin, Yen-Heng A1 Wong, Jing-Chao A1 Peng, Yong-Sheng PB Elsevier BV YR 2017 SN 1452-3981 JF International Journal of Electrochemical Science VO 12 IS 9 SP 8651 OP 8662 LK http://dx.doi.org/https://doi.org/10.20964/2017.09.42 DO https://doi.org/10.20964/2017.09.42 SF ELIB - SuUB Bremen
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