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1 Ergebnisse
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NBT stress and radiation related degradation and underlying..:
Davidovic, Vojkan
;
Dankovic, Danijel
;
Golubovic, Snezana
...
Facta universitatis - series: Electronics and Energetics. 31 (2018) 3 - p. 367-388 , 2018
Link:
https://doi.org/10.2298/fuee1803367d
RT Journal T1 <Title>NBT stress and radiation related degradation and underlying mechanisms in power VDMOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.2298_fuee1803367d&Exemplar=1&LAN=DE A1 Davidovic, Vojkan A1 Dankovic, Danijel A1 Golubovic, Snezana A1 Djoric-Veljkovic, Snezana A1 Manic, Ivica A1 Prijic, Zoran A1 Prijic, Aneta A1 Stojadinovic, Ninoslav A1 Stankovic, Srboljub PB National Library of Serbia YR 2018 SN 0353-3670 SN 2217-5997 JF Facta universitatis - series: Electronics and Energetics VO 31 IS 3 SP 367 OP 388 LK http://dx.doi.org/https://doi.org/10.2298/fuee1803367d DO https://doi.org/10.2298/fuee1803367d SF ELIB - SuUB Bremen
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