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1 Ergebnisse
1
Characterization of Electrical Tree Degradation of Epoxy Re..:
Aung, Hein Htet
;
Wang, Yuhuai
;
Li, Jin
..
Chinese Journal of Electrical Engineering. 10 (2024) 1 - p. 12-20 , 2024
Link:
https://doi.org/10.23919/cjee.2023.000047
RT Journal T1 <Title>Characterization of Electrical Tree Degradation of Epoxy Resin under Thermal and Temperature Stresses by Photoelastic Effect</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.23919_cjee.2023.000047&Exemplar=1&LAN=DE A1 Aung, Hein Htet A1 Wang, Yuhuai A1 Li, Jin A1 Zhang, Ying A1 Takada, Tatsuo PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 2096-1529 JF Chinese Journal of Electrical Engineering VO 10 IS 1 SP 12 OP 20 LK http://dx.doi.org/https://doi.org/10.23919/cjee.2023.000047 DO https://doi.org/10.23919/cjee.2023.000047 SF ELIB - SuUB Bremen
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