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Reliability modeling of the bivariate deteriorating product..:
Fuqiang, Sun
;
Hongxuan, Guo
;
Jingcheng, Liu
Journal of Systems Engineering and Electronics. 32 (2021) 4 - p. 971-983 , 2021
Link:
https://doi.org/10.23919/jsee.2021.000083
RT Journal T1 <Title>Reliability modeling of the bivariate deteriorating product with both monotonic and non-monotonic degradation paths</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.23919_jsee.2021.000083&Exemplar=1&LAN=DE A1 Fuqiang, Sun A1 Hongxuan, Guo A1 Jingcheng, Liu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 1004-4132 JF Journal of Systems Engineering and Electronics VO 32 IS 4 SP 971 OP 983 LK http://dx.doi.org/https://doi.org/10.23919/jsee.2021.000083 DO https://doi.org/10.23919/jsee.2021.000083 SF ELIB - SuUB Bremen
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