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Surface micromorphology characterization of PDI8-CN2 thin f..:
Ţălu, Ştefan
;
Kulesza, Slawomir
;
Bramowicz, Miroslaw
...
Materials Science-Poland. 38 (2020) 2 - p. 334-340 , 2020
Link:
https://doi.org/10.2478/msp-2020-0033
RT Journal T1
Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis
UL https://suche.suub.uni-bremen.de/peid=cr-10.2478_msp-2020-0033&Exemplar=1&LAN=DE A1 Ţălu, Ştefan A1 Kulesza, Slawomir A1 Bramowicz, Miroslaw A1 Solaymani, Shahram A1 Ţălu, Mihai A1 Nezafat, Negin Beryani A1 Rezaee, Sahar PB Walter de Gruyter GmbH YR 2020 SN 2083-134X JF Materials Science-Poland VO 38 IS 2 SP 334 OP 340 LK http://dx.doi.org/https://doi.org/10.2478/msp-2020-0033 DO https://doi.org/10.2478/msp-2020-0033 SF ELIB - SuUB Bremen
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