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1 Ergebnisse
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Novel High Sensitivity EUV Photoresist for Sub-7 nm Node:
Nagai, Tomoki
;
Nakagawa, Hisashi
;
Naruoka, Takehiko
...
Journal of Photopolymer Science and Technology. 29 (2016) 3 - p. 475-478 , 2016
Link:
https://doi.org/10.2494/photopolymer.29.475
RT Journal T1
Novel High Sensitivity EUV Photoresist for Sub-7 nm Node
UL https://suche.suub.uni-bremen.de/peid=cr-10.2494_photopolymer.29.475&Exemplar=1&LAN=DE A1 Nagai, Tomoki A1 Nakagawa, Hisashi A1 Naruoka, Takehiko A1 Dei, Satoshi A1 Tagawa, Seiichi A1 Oshima, Akihiro A1 Nagahara, Seiji A1 Shiraishi, Gosuke A1 Yoshihara, Kosuke A1 Terashita, Yuichi A1 Minekawa, Yukie A1 Buitrago, Elizabeth A1 Ekinci, Yasin A1 Yildirim, Oktay A1 Meeuwissen, Marieke A1 Hoefnagels, Rik A1 Rispens, Gijsbert A1 Verspaget, Coen A1 Maas, Raymond PB Technical Association of Photopolymers, Japan YR 2016 SN 0914-9244 SN 1349-6336 JF Journal of Photopolymer Science and Technology VO 29 IS 3 SP 475 OP 478 LK http://dx.doi.org/https://doi.org/10.2494/photopolymer.29.475 DO https://doi.org/10.2494/photopolymer.29.475 SF ELIB - SuUB Bremen
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