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Formation of radiation-disturbed layer in Al/SiO2/n-Si stru..:

Nha, V. Q. ; Thang, L. V. ; Thuy Linh, H. T...
Hue University Journal of Science: Natural Science.  129 (2020)  1D - p. 71-75 , 2020
Link: https://doi.org/10.26459/hueuni-jns.v129i1d.5765