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Reliability analysis of gamma- and X-ray TID effects, on a ..:
Vilas Bôas, Alexis Cristiano
;
Gabriel Alberton, Saulo
;
Medina, Nilberto
...
Journal of Integrated Circuits and Systems. 16 (2021) 3 - p. 1-7 , 2021
Link:
https://doi.org/10.29292/jics.v16i3.566
RT Journal T1
Reliability analysis of gamma- and X-ray TID effects, on a commercial AlGaN/GaN based FET
UL https://suche.suub.uni-bremen.de/peid=cr-10.29292_jics.v16i3.566&Exemplar=1&LAN=DE A1 Vilas Bôas, Alexis Cristiano A1 Gabriel Alberton, Saulo A1 Medina, Nilberto A1 Ângelo Paulino, Vitor A1 Assis Melo, Marco Antonio A1 Baginski Santos, Roberto A1 Giacomini, Renato A1 Cavalcante, Tássio A1 Galhardo Vaz, Rafael A1 Junior, Evaldo A1 Seixas, Luis A1 Finco, Saulo A1 Guazzelli, Marcilei PB Journal of Integrated Circuits and Systems YR 2021 SN 1872-0234 SN 1807-1953 JF Journal of Integrated Circuits and Systems VO 16 IS 3 SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.29292/jics.v16i3.566 DO https://doi.org/10.29292/jics.v16i3.566 SF ELIB - SuUB Bremen
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