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Method for predicting the effects of radiative relaxation i..:
Panyushkin, N. N.
;
Matveev, N. N.
Bulletin of the Russian Academy of Sciences: Physics. 80 (2016) 9 - p. 1152-1154 , 2016
Link:
https://doi.org/10.3103/s1062873816090343
RT Journal T1 <Title>Method for predicting the effects of radiative relaxation in bipolar integrated circuits</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3103_s1062873816090343&Exemplar=1&LAN=DE A1 Panyushkin, N. N. A1 Matveev, N. N. PB Allerton Press YR 2016 SN 1062-8738 SN 1934-9432 JF Bulletin of the Russian Academy of Sciences: Physics VO 80 IS 9 SP 1152 OP 1154 LK http://dx.doi.org/https://doi.org/10.3103/s1062873816090343 DO https://doi.org/10.3103/s1062873816090343 SF ELIB - SuUB Bremen
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