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Regression analysis of transverse chip shrinkage:
Eremin, O. N.
;
Blokhin, V. V.
Russian Engineering Research. 28 (2008) 11 - p. 1146-1148 , 2008
Link:
https://doi.org/10.3103/s1068798x08110270
RT Journal T1 <Title>Regression analysis of transverse chip shrinkage</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3103_s1068798x08110270&Exemplar=1&LAN=DE A1 Eremin, O. N. A1 Blokhin, V. V. PB Allerton Press YR 2008 SN 1068-798X SN 1934-8088 JF Russian Engineering Research VO 28 IS 11 SP 1146 OP 1148 LK http://dx.doi.org/https://doi.org/10.3103/s1068798x08110270 DO https://doi.org/10.3103/s1068798x08110270 SF ELIB - SuUB Bremen
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