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Accuracy of measurement of dynamic surface deformations by ..:
Boden, F.
;
Kirmse, T.
;
Poroikov, A. Yu.
...
Optoelectronics, Instrumentation and Data Processing. 50 (2014) 5 - p. 474-481 , 2014
Link:
https://doi.org/10.3103/s8756699014050057
RT Journal T1 <Title>Accuracy of measurement of dynamic surface deformations by the image pattern correlation technique</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3103_s8756699014050057&Exemplar=1&LAN=DE A1 Boden, F. A1 Kirmse, T. A1 Poroikov, A. Yu. A1 Rinkevichyus, B. S. A1 Skornyakova, N. M. A1 Shashkova, I. A. PB Allerton Press YR 2014 SN 8756-6990 SN 1934-7944 JF Optoelectronics, Instrumentation and Data Processing VO 50 IS 5 SP 474 OP 481 LK http://dx.doi.org/https://doi.org/10.3103/s8756699014050057 DO https://doi.org/10.3103/s8756699014050057 SF ELIB - SuUB Bremen
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