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X-ray Diffraction Tomography Using Laboratory Sources for S..:

Zolotov, D. A. ; Asadchikov, V. E. ; Buzmakov, A. V....
Optoelectronics, Instrumentation and Data Processing.  55 (2019)  2 - p. 126-132 , 2019
Link: https://doi.org/10.3103/s8756699019020031