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On Error Probability and Computational Complexity of Patter..:
Lange, M. M.
;
Paramonov, S. V.
Optoelectronics, Instrumentation and Data Processing. 58 (2022) 5 - p. 440-447 , 2022
Link:
https://doi.org/10.3103/s8756699022050077
RT Journal T1 <Title>On Error Probability and Computational Complexity of Pattern Recognition in a Metric Space of the Tree-Structured Representations</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3103_s8756699022050077&Exemplar=1&LAN=DE A1 Lange, M. M. A1 Paramonov, S. V. PB Allerton Press YR 2022 SN 8756-6990 SN 1934-7944 JF Optoelectronics, Instrumentation and Data Processing VO 58 IS 5 SP 440 OP 447 LK http://dx.doi.org/https://doi.org/10.3103/s8756699022050077 DO https://doi.org/10.3103/s8756699022050077 SF ELIB - SuUB Bremen
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