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PVT Analysis and Behavioral Modeling of Doherty and Envelop..:
Akhter, Muhammad Ovais
;
M. Amin, Najam
;
Rashid Masud, Aurangzeb
Sir Syed University Research Journal of Engineering & Technology. 13 (2024) 2 - p. , 2024
Link:
https://doi.org/10.33317/ssurj.589
RT Journal T1 <Title>PVT Analysis and Behavioral Modeling of Doherty and Envelope Tracking RF ULP Power Amplifiers using 65 nm CMOS Technology</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.33317_ssurj.589&Exemplar=1&LAN=DE A1 Akhter, Muhammad Ovais A1 M. Amin, Najam A1 Rashid Masud, Aurangzeb PB Sir Syed University of Engineering and Technology YR 2024 SN 2415-2048 SN 1997-0641 JF Sir Syed University Research Journal of Engineering & Technology VO 13 IS 2 LK http://dx.doi.org/https://doi.org/10.33317/ssurj.589 DO https://doi.org/10.33317/ssurj.589 SF ELIB - SuUB Bremen
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