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1 Ergebnisse
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Influence of the Thickness of TiO2/TiO2-x Layers on the Beh..:
Kim, Han-Sang
;
Kim, Sung-Jin
Korean Journal of Metals and Materials. 57 (2019) 2 - p. 84-90 , 2019
Link:
https://doi.org/10.3365/kjmm.2019.57.2.84
RT Journal T1 <Title>Influence of the Thickness of TiO2/TiO2-x Layers on the Behavior of a Memristor Device</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3365_kjmm.2019.57.2.84&Exemplar=1&LAN=DE A1 Kim, Han-Sang A1 Kim, Sung-Jin PB The Korean Institute of Metals and Materials YR 2019 SN 1738-8228 SN 2288-8241 JF Korean Journal of Metals and Materials VO 57 IS 2 SP 84 OP 90 LK http://dx.doi.org/https://doi.org/10.3365/kjmm.2019.57.2.84 DO https://doi.org/10.3365/kjmm.2019.57.2.84 SF ELIB - SuUB Bremen
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