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1 Ergebnisse
1
Mueller Matrix Ellipsometric Characterization of Nanoscale ..:
Li, Huihui
;
Cui, Changcai
;
Lu, Jing
...
Frontiers in Physics. 9 (2022) - p. , 2022
Link:
https://doi.org/10.3389/fphy.2021.820637
RT Journal T1
Mueller Matrix Ellipsometric Characterization of Nanoscale Subsurface Damage of 4H-SiC Wafers: From Grinding to CMP
UL https://suche.suub.uni-bremen.de/peid=cr-10.3389_fphy.2021.820637&Exemplar=1&LAN=DE A1 Li, Huihui A1 Cui, Changcai A1 Lu, Jing A1 Hu, Zhongwei A1 Lin, Wuqing A1 Bian, Subiao A1 Xu, Xipeng PB Frontiers Media SA YR 2022 SN 2296-424X JF Frontiers in Physics VO 9 LK http://dx.doi.org/https://doi.org/10.3389/fphy.2021.820637 DO https://doi.org/10.3389/fphy.2021.820637 SF ELIB - SuUB Bremen
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