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Opto-Acoustic Method for the Characterization of Thin-Film ..:
Yoshida, Sanichiro
;
Didie, David
;
Didie, Daniel
...
Applied Sciences. 6 (2016) 6 - p. 163 , 2016
Link:
https://doi.org/10.3390/app6060163
RT Journal T1
Opto-Acoustic Method for the Characterization of Thin-Film Adhesion
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_app6060163&Exemplar=1&LAN=DE A1 Yoshida, Sanichiro A1 Didie, David A1 Didie, Daniel A1 Sasaki, Tomohiro A1 Park, Hae-Sung A1 Park, Ik-Keun A1 Gurney, David PB MDPI AG YR 2016 SN 2076-3417 JF Applied Sciences VO 6 IS 6 SP 163 LK http://dx.doi.org/https://doi.org/10.3390/app6060163 DO https://doi.org/10.3390/app6060163 SF ELIB - SuUB Bremen
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