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1 Ergebnisse
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Impact of the Ferroelectric Stack Lamination in Si Doped Ha..:
Ali, Tarek
;
Kühnel, Kati
;
Olivo, Ricardo
...
Electronic Materials. 2 (2021) 3 - p. 344-369 , 2021
Link:
https://doi.org/10.3390/electronicmat2030024
RT Journal T1
Impact of the Ferroelectric Stack Lamination in Si Doped Hafnium Oxide (HSO) and Hafnium Zirconium Oxide (HZO) Based FeFETs: Toward High-Density Multi-Level Cell and Synaptic Storage
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_electronicmat2030024&Exemplar=1&LAN=DE A1 Ali, Tarek A1 Kühnel, Kati A1 Olivo, Ricardo A1 Lehninger, David A1 Müller, Franz A1 Lederer, Maximilian A1 Rudolph, Matthias A1 Oehler, Sebastian A1 Mertens, Konstantin A1 Hoffmann, Raik A1 Zimmermann, Katrin A1 Schramm, Philipp A1 Metzger, Joachim A1 Binder, Robert A1 Czernohorsky, Malte A1 Kämpfe, Thomas A1 Seidel, Konrad A1 Müller, Johannes A1 Van Houdt, Jan A1 Eng, Lukas M. PB MDPI AG YR 2021 SN 2673-3978 JF Electronic Materials VO 2 IS 3 SP 344 OP 369 LK http://dx.doi.org/https://doi.org/10.3390/electronicmat2030024 DO https://doi.org/10.3390/electronicmat2030024 SF ELIB - SuUB Bremen
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