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1 Ergebnisse
1
Optimization of Self-Heating Driven Leakage Current Propert..:
Park, Chuntaek
;
Yun, Ilgu
Electronics. 10 (2021) 21 - p. 2570 , 2021
Link:
https://doi.org/10.3390/electronics10212570
RT Journal T1
Optimization of Self-Heating Driven Leakage Current Properties of Gate-All-Around Field-Effect Transistors Using Neural Network Modeling and Genetic Algorithm
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_electronics10212570&Exemplar=1&LAN=DE A1 Park, Chuntaek A1 Yun, Ilgu PB MDPI AG YR 2021 SN 2079-9292 JF Electronics VO 10 IS 21 SP 2570 LK http://dx.doi.org/https://doi.org/10.3390/electronics10212570 DO https://doi.org/10.3390/electronics10212570 SF ELIB - SuUB Bremen
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