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1 Ergebnisse
1
Evaluation Index for IVIS Integration Test under a Closed C..:
Chen, Jialiang
;
Li, Huizhe
;
Hu, Zhaozheng
..
Electronics. 11 (2022) 22 - p. 3830 , 2022
Link:
https://doi.org/10.3390/electronics11223830
RT Journal T1
Evaluation Index for IVIS Integration Test under a Closed Condition Based on the Analytic Hierarchy Process
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_electronics11223830&Exemplar=1&LAN=DE A1 Chen, Jialiang A1 Li, Huizhe A1 Hu, Zhaozheng A1 Liu, Kai A1 Hou, Yue PB MDPI AG YR 2022 SN 2079-9292 JF Electronics VO 11 IS 22 SP 3830 LK http://dx.doi.org/https://doi.org/10.3390/electronics11223830 DO https://doi.org/10.3390/electronics11223830 SF ELIB - SuUB Bremen
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