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1 Ergebnisse
1
AMFF-YOLOX: Towards an Attention Mechanism and Multiple Fea..:
Chen, Yu
;
Tang, Yongwei
;
Hao, Huijuan
...
Electronics. 12 (2023) 7 - p. 1662 , 2023
Link:
https://doi.org/10.3390/electronics12071662
RT Journal T1
AMFF-YOLOX: Towards an Attention Mechanism and Multiple Feature Fusion Based on YOLOX for Industrial Defect Detection
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_electronics12071662&Exemplar=1&LAN=DE A1 Chen, Yu A1 Tang, Yongwei A1 Hao, Huijuan A1 Zhou, Jun A1 Yuan, Huimiao A1 Zhang, Yu A1 Zhao, Yuanyuan PB MDPI AG YR 2023 SN 2079-9292 JF Electronics VO 12 IS 7 SP 1662 LK http://dx.doi.org/https://doi.org/10.3390/electronics12071662 DO https://doi.org/10.3390/electronics12071662 SF ELIB - SuUB Bremen
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