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1 Ergebnisse
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A Comprehensive Overview of the Temperature-Dependent Model..:
Crupi, Giovanni
;
Latino, Mariangela
;
Gugliandolo, Giovanni
...
Electronics. 12 (2023) 8 - p. 1771 , 2023
Link:
https://doi.org/10.3390/electronics12081771
RT Journal T1
A Comprehensive Overview of the Temperature-Dependent Modeling of the High-Power GaN HEMT Technology Using mm-Wave Scattering Parameter Measurements
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_electronics12081771&Exemplar=1&LAN=DE A1 Crupi, Giovanni A1 Latino, Mariangela A1 Gugliandolo, Giovanni A1 Marinković, Zlatica A1 Cai, Jialin A1 Bosi, Gianni A1 Raffo, Antonio A1 Fazio, Enza A1 Donato, Nicola PB MDPI AG YR 2023 SN 2079-9292 JF Electronics VO 12 IS 8 SP 1771 LK http://dx.doi.org/https://doi.org/10.3390/electronics12081771 DO https://doi.org/10.3390/electronics12081771 SF ELIB - SuUB Bremen
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