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1 Ergebnisse
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Investigation of the Effect of Different SiNx Thicknesses o..:
Hsu, Che-Wei
;
Lin, Yueh-Chin
;
Lee, Ming-Wen
.
Electronics. 12 (2023) 20 - p. 4336 , 2023
Link:
https://doi.org/10.3390/electronics12204336
RT Journal T1
Investigation of the Effect of Different SiNx Thicknesses on the Characteristics of AlGaN/GaN High-Electron-Mobility Transistors in Ka-Band
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_electronics12204336&Exemplar=1&LAN=DE A1 Hsu, Che-Wei A1 Lin, Yueh-Chin A1 Lee, Ming-Wen A1 Chang, Edward-Yi PB MDPI AG YR 2023 SN 2079-9292 JF Electronics VO 12 IS 20 SP 4336 LK http://dx.doi.org/https://doi.org/10.3390/electronics12204336 DO https://doi.org/10.3390/electronics12204336 SF ELIB - SuUB Bremen
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