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Assessment of Global Variability in UTBB MOSFETs in Subthre..:
Makovejev, Sergej
;
Esfeh, Babak
;
Andrieu, François
...
Journal of Low Power Electronics and Applications. 4 (2014) 3 - p. 201-213 , 2014
Link:
https://doi.org/10.3390/jlpea4030201
RT Journal T1 <Title>Assessment of Global Variability in UTBB MOSFETs in Subthreshold Regime</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_jlpea4030201&Exemplar=1&LAN=DE A1 Makovejev, Sergej A1 Esfeh, Babak A1 Andrieu, François A1 Raskin, Jean-Pierre A1 Flandre, Denis A1 Kilchytska, Valeriya PB MDPI AG YR 2014 SN 2079-9268 JF Journal of Low Power Electronics and Applications VO 4 IS 3 SP 201 OP 213 LK http://dx.doi.org/https://doi.org/10.3390/jlpea4030201 DO https://doi.org/10.3390/jlpea4030201 SF ELIB - SuUB Bremen
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